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Doping Techniques

In silicon transistors, selective ion implantation is the most widely used technique for achieving controlled doping. However, monolayer 1D/2D materials are highly fragile when exposed to ion or plasma bombardment. As a result, conventional ion implantation is not feasible for these ultrathin materials, necessitating the development of new doping techniques.

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Email: pohsunho@mx.nthu.edu.tw | PI office: Delta Building T408 |  Lab: Materials Science Building R425, R514

 

​​​ National Tsing Hua University | Department of Materials Science and Engineering | 101, Section 2 Kuang Fu Road, Hsinchu, Taiwan 

 
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